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Andrew Sundstrom
Andrew Sundstrom
Physics-Informed AI R&D at Siemens
Verified email at acm.org - Homepage
Title
Cited by
Cited by
Year
Copy number variant analysis of human embryonic stem cells
H Wu, KJ Kim, K Mehta, S Paxia, A Sundstrom, T Anantharaman, ...
Stem Cells 26 (6), 1484-1489, 2008
612008
Image analysis and length estimation of biomolecules using AFM
A Sundstrom, S Cirrone, S Paxia, C Hsueh, R Kjolby, JK Gimzewski, ...
IEEE Transactions on Information Technology in Biomedicine, 2012
172012
What can information-asymmetric games tell us about the context of Crick's ‘frozen accident’?
J Jee, A Sundstrom, SE Massey, B Mishra
Journal of the Royal Society Interface 10 (88), 20130614, 2013
142013
Identifying individual DNA species in a complex mixture by precisely measuring the spacing between nicking restriction enzymes with atomic force microscope
J Reed, C Hsueh, ML Lam, R Kjolby, A Sundstrom, B Mishra, ...
Journal of the Royal Society Interface, 2012
142012
Histological image processing features induce a quantitative characterization of chronic tumor hypoxia
A Sundstrom, E Grabocka, D Bar-Sagi, B Mishra
PloS one 11 (4), e0153623, 2016
102016
Dynamic training for assembly lines
MC Putman, V Pinskiy, ES Kim, A Sundstrom
US Patent 10,481,579, 2019
52019
Methods and systems for measuring a property of a macromolecule
JC Reed, B Mishra, A Sundstrom
US Patent 9,995,766, 2018
52018
Simulating heterogeneous tumor cell populations
A Sundstrom, D Bar-Sagi, B Mishra
Plos one 11 (12), e0168984, 2016
32016
Measuring biomolecules: an image processing and length estimation pipeline using atomic force microscopy to measure DNA and RNA with high precision
A Sundstrom
Master's Thesis. New York University. Available at, 2008
32008
Dynamic monitoring and securing of factory processes, equipment and automated systems
MC Putman, JB Putman, V Pinskiy, D Limoge, A Sundstrom, J Williams III
US Patent 11,100,221, 2021
22021
Defect Detection System
T Ivanov, D Babeshko, V Pinskiy, MC Putman, A Sundstrom
US Patent App. 17/195,760, 2021
12021
Imitation Learning in a Manufacturing Environment
MC Putman, A Sundstrom, D Limoge, V Pinskiy, AR Nirmaleswaran, ...
US Patent App. 17/652,607, 2022
2022
Assembly error correction for assembly lines
MC Putman, V Pinskiy, ES Kim, A Sundstrom
US Patent App. 17/646,063, 2022
2022
Dynamic training for assembly lines
MC Putman, V Pinskiy, ES Kim, A Sundstrom
US Patent App. 17/452,169, 2022
2022
Assembly error correction for assembly lines
MC Putman, V Pinskiy, ES Kim, A Sundstrom
US Patent 11,209,795, 2021
2021
Dynamic monitoring and securing of factory processes, equipment and automated systems
MC Putman, JB Putman, V Pinskiy, D Limoge, A Sundstrom, J Williams III
US Patent App. 17/445,657, 2021
2021
Method, systems and apparatus for intelligently emulating factory control systems and simulating response data
MC Putman, JB Putman, V Pinskiy, A Sundstrom, J Williams III
US Patent App. 17/444,621, 2021
2021
Dynamic training for assembly lines
MC Putman, V Pinskiy, ES Kim, A Sundstrom
US Patent 11,156,982, 2021
2021
Dynamic monitoring and securing of factory processes, equipment and automated systems
MC Putman, JB Putman, V Pinskiy, D Limoge, A Sundstrom, J Williams III
US Patent App. 17/304,614, 2021
2021
Systems, Methods, and Media for Manufacturing Processes
A Sundstrom, ES Kim, D Limoge, V Pinskiy, MC Putman
US Patent App. 17/304,349, 2021
2021
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