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Zhou XU
Zhou XU
Chongqing University & The Hong Kong Polytechnic University
Verified email at cqu.edu.cn - Homepage
Title
Cited by
Cited by
Year
Noisy-As-Clean: Learning unsupervised denoising from the corrupted image
J Xu, Y Huang, MM Cheng, L Liu, F Zhu, Z Xu, L Shao
arXiv preprint arXiv:1906.06878, 2020
192*2020
Software defect prediction based on kernel PCA and weighted extreme learning machine
Z Xu, J Liu, X Luo, Z Yang, Y Zhang, P Yuan, Y Tang, T Zhang
IST--Information and Software Technology, 2018
1772018
The impact of feature selection on defect prediction performance: An empirical comparison
Z Xu, J Liu, Z Yang, G An, X Jia
ISSRE--International Symposium on Software Reliability Engineering, 309-320, 2016
1682016
Cross-version defect prediction via hybrid active learning with kernel principal component analysis
Z Xu, J Liu, X Luo, T Zhang
SANER--International Conference on Software Analysis, Evolution and …, 2018
802018
MICHAC: Defect prediction via feature selection based on maximal information coefficient with hierarchical agglomerative clustering
Z Xu, J Xuan, J Liu, X Cui
SANER--International Conference on Software Analysis, Evolution, and …, 2016
782016
Cross Project Defect Prediction via Balanced Distribution Adaptation Based Transfer Learning
Z Xu, S Pang, T Zhang, L Xiapu, L Jin, Y Tang, X Yu, L Xue
JCST--Journal Of Computer Science and Technology, 2019
762019
LDFR: Learning Deep Feature Representation for Software Defect Prediction
Z Xu, S Li, J Xu, J Liu, X Luo, Y Zhang, T Zhang, J Keung, T Yutian
JSS--Journal of Systems and Software, 2019
672019
Bug Severity Prediction Using Question-and-Answer Pairs from Stack Overflow
Y Tan, S Xu, Z Wang, T Zhang, Z Xu, X Luo
NASAC--National Software Application Conference, 2019
622019
Two-Stage Attention-Based Model for Code Search with Textual and Structural Features
L Xu, H Yang, C Liu, J Shuai, M Yan, Y Lei, Z Xu
2021 IEEE International Conference on Software Analysis, Evolution and …, 2021
552021
Improving Ranking-Oriented Defect Prediction Using a Cost-Sensitive Ranking SVM
X Yu, J Liu, JW Keung, Q Li, KE Bennin, Z Xu, J Wang, X Cui
TR--IEEE Transactions on Reliability, 2019
512019
A comprehensive comparative study of clustering-based unsupervised defect prediction models
Z Xu, L Li, M Yan, J Liu, X Luo, J Grundy, Y Zhang, X Zhang
Journal of Systems and Software 172, 110862, 2020
492020
An Empirical Study of Learning to Rank Techniques for Effort-Aware Defect Prediction
X Yu, KE Bennin, J Liu, JW Keung, X Yin, Z Xu
SANER--International Conference on Software Analysis, Evolution and …, 2019
462019
Cross Version Defect Prediction with Representative Data via Sparse Subset Selection
Z Xu, S Li, Y Tang, X Luo, T Zhang, J Liu, J Xu
ICPC--International Conference on Program Comprehension, 2018
412018
Simplified deep forest model based just-in-time defect prediction for Android mobile apps
K Zhao, Z Xu, T Zhang, Y Tang, M Yan
IEEE Transactions on Reliability 70 (2), 848-859, 2021
402021
TSTSS: A Two-Stage Training Subset Selection Framework for Cross Version Defect Prediction
Z Xu, S Li, X Luo, J Liu, T Zhang, Y Tang, J Xu, P Yuan, J Keung
JSS--Journal of Systems and Software, 2019
402019
HDA: Cross-Project Defect Prediction via Heterogeneous Domain Adaptation With Dictionary Learning
Z Xu, P Yuan, T Zhang, Y Tang, S Li, Z Xia
IEEE ACCESS, 2018
382018
Effective Prediction of Bug-Fixing Priority via Weighted Graph Convolutional Networks
S Fang, Y Tan, T Zhang, Z Xu, H Liu
IEEE Transactions on Reliability 70 (2), 563-574, 2021
322021
Effort-Aware Just-in-Time Bug Prediction for Mobile Apps Via Cross-Triplet Deep Feature Embedding
Z Xu, K Zhao, T Zhang, C Fu, M Yan, Z Xie, X Zhang, G Catolino
IEEE Transactions on Reliability, 2021
292021
Improving Log-Based Anomaly Detection with Component-Aware Analysis
K Yin, M Yan, L Xu, Z Xu, Z Li, D Yang, X Zhang
2020 IEEE International Conference on Software Maintenance and Evolution …, 2020
292020
A comprehensive investigation of the impact of feature selection techniques on crashing fault residence prediction models
K Zhao, Z Xu, M Yan, T Zhang, D Yang, W Li
Information and Software Technology 139, 106652, 2021
262021
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Articles 1–20