Michael Hsiao

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Janak H. PatelElectrical and Computer Engineering, University of Illinois at Urbana-ChampaignVerified email at illinois.edu
Mainak BangaSoftware Engineer, IntelVerified email at intel.com
Dong Sam HaProfessor of Electrical and Computer Engineering, Virginia TechVerified email at vt.edu
A. Lynn AbbottProfessor, Electrical & Computer Engineering, Virginia TechVerified email at vt.edu
Tom MartinProfessor, Dept. of Electrical and Computer Engineering, Virginia TechVerified email at vt.edu
Maheshwar ChandrasekarVirgnia TechVerified email at xilinx.com
sarvesh prabhuvirginia techVerified email at intel.com
Leyla NazhandaliAssociate Professor, Bradley Department of Electrical and Computer Engineering, Virginia TechVerified email at vt.edu
Charles W. BostianAlumni Distinguished Professor Emeritus of Electrical and Computer Engineering, Virginia TechVerified email at vt.edu
Mark M. TehranipoorIntel Charles E. Young Endowed Chair Professor, ECE, University of FloridaVerified email at ufl.edu
Chung-Hsing HsuOak Ridge National LaboratoryVerified email at ornl.gov
Chao WangUniversity of Southern CaliforniaVerified email at usc.edu
Mustafa ElNainayProfessor, Computer and Systems Engineering, Alexandria University & Alamein InternationalVerified email at aiu.edu.eg
Indradeep GhoshFujitsu Labs. of AmericaVerified email at us.fujitsu.com
Anand RaghunathanProfessor of Electrical and Computer Engineering, Purdue UniversityVerified email at purdue.edu
R. Michael BuehrerVirginia TechVerified email at vt.edu
Jeffrey ReedProfessor of Electrical and Computer EngineeringVerified email at vt.edu
Allen MacKenzieChair and Professor of Electrical and Computer Engineering, Tennessee Tech UniversityVerified email at tntech.edu
Thomas HouBradley Distinguished Professor, IEEE Fellow, Virginia Tech, USAVerified email at vt.edu
Jerry ParkProfessor, IEEE Fellow, Virginia Tech, USAVerified email at vt.edu

Michael Hsiao

Professor, Virginia Tech, IEEE Fellow

Verified email at vt.edu

Testing verification diagnosis security DFT/DFV


Title Sort by citations Sort by year Sort by title	Cited by Cited by	Year
Hardware Trojan attacks: Threat analysis and countermeasures S Bhunia, MS Hsiao, M Banga, S Narasimhan Proceedings of the IEEE 102 (8), 1229-1247, 2014	674	2014
A region based approach for the identification of hardware Trojans M Banga, MS Hsiao 2008 IEEE International Workshop on Hardware-Oriented Security and Trust, 40-47, 2008	311	2008
A novel sustained vector technique for the detection of hardware Trojans M Banga, MS Hsiao 2009 22nd international conference on VLSI design, 327-332, 2009	244	2009
Denial-of-Service Attacks on Battery-powered Mobile Computers T Martin, M Hsiao, D Ha, J Krishnaswami IEEE International Conference on Pervasive Computing and Communications, 309-318, 2004	239	2004
Sequential circuit test generation using dynamic state traversal MS Hsiao, EM Rudnick, JH Patel Proceedings European Design and Test Conference. ED & TC 97, 22-28, 1997	212	1997
Protection against hardware trojan attacks: Towards a comprehensive solution S Bhunia, M Abramovici, D Agrawal, P Bradley, MS Hsiao, J Plusquellic, ... IEEE Design & Test 30 (3), 6-17, 2013	157	2013
Cognitive radio and networking research at Virginia Tech AB MacKenzie, JH Reed, P Athanas, CW Bostian, RM Buehrer, ... Proceedings of the IEEE 97 (4), 660-688, 2009	157	2009
Trusted RTL: Trojan detection methodology in pre-silicon designs M Banga, MS Hsiao 2010 IEEE international symposium on hardware-oriented security and trust …, 2010	137	2010
Towards an intrusion detection system for battery exhaustion attacks on mobile computing devices DC Nash, TL Martin, DS Ha, MS Hsiao Third IEEE international conference on pervasive computing and …, 2005	125	2005
Compiler-directed dynamic voltage/frequency scheduling for energy reduction in microprocessors CH Hsu, U Kremer, M Hsiao Proceedings of the 2001 international symposium on low power electronics and …, 2001	113	2001
Guided test generation for isolation and detection of embedded Trojans in ICs M Banga, M Chandrasekar, L Fang, MS Hsiao Proceedings of the 18th ACM Great Lakes symposium on VLSI, 363-366, 2008	112	2008
Compiler-directed dynamic frequency and voltage scheduling CH Hsu, U Kremer, M Hsiao International Workshop on Power-Aware Computer Systems, 65-81, 2000	112	2000
VITAMIN: Voltage inversion technique to ascertain malicious insertions in ICs M Banga, MS Hsiao 2009 IEEE International Workshop on Hardware-Oriented Security and Trust …, 2009	95	2009
Interlocking obfuscation for anti-tamper hardware AR Desai, MS Hsiao, C Wang, L Nazhandali, S Hall Proceedings of the eighth annual cyber security and information intelligence …, 2013	91	2013
Efficient sequential ATPG for functional RTL circuits L Zhang, I Ghosh, M Hsiao ITC 3, 290-298, 2003	74	2003
ALAPTF: A new transition fault model and the ATPG algorithm P Gupta, MS Hsiao 2004 International Conferce on Test, 1053-1060, 2004	72	2004
Automatic test generation using genetically-engineered distinguishing sequences MS Hsiao, EM Rudnick, JH Patel Proceedings of 14th VLSI Test Symposium, 216-223, 1996	71	1996
Fast Algorithms for Static Compaction of Sequential Circuit Test Vectors. MS Hsiao, EM Rudnick, JH Patel vts, 188-195, 1997	69	1997
Testing, verification, and diagnosis in the presence of unknowns A Jain, V Boppana, R Mukherjee, J Jain, M Fujita, M Hsiao Proceedings 18th IEEE VLSI Test Symposium, 263-269, 2000	68	2000
E ects of delay model in peak power estimation of VLSI sequential circuits," MS Hsiao, EM Rudnick, JH Patel Proc. Int. Conf. CAD, 45-51, 1997	65	1997

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