| Scattering lens resolves sub-100 nm structures with visible light EG van Putten, D Akbulut, J Bertolotti, WL Vos, A Lagendijk, AP Mosk Physical review letters 106 (19), 193905, 2011 | 367 | 2011 |
| Focusing light through random photonic media by binary amplitude modulation D Akbulut, TJ Huisman, EG van Putten, WL Vos, AP Mosk Optics express 19 (5), 4017-4029, 2011 | 250 | 2011 |
| Ultralow threshold laser action from toroidal polymer microcavity A Tulek, D Akbulut, M Bayindir Applied Physics Letters 94 (20), 2009 | 59 | 2009 |
| Optical transmission matrix as a probe of the photonic strength D Akbulut, T Strudley, J Bertolotti, EPAM Bakkers, A Lagendijk, ... Physical Review A 94 (4), 043817, 2016 | 22 | 2016 |
| Observation of intensity statistics of light transmitted through 3D random media T Strudley, D Akbulut, WL Vos, A Lagendijk, AP Mosk, OL Muskens Optics letters 39 (21), 6347-6350, 2014 | 14 | 2014 |
| Method and apparatus for inspection and metrology PD Van Voorst, D Akbulut, K Van Berkel, JJM Van De Wijdeven, F Zijp US Patent 9,811,001, 2017 | 13 | 2017 |
| Measurements of strong correlations in the transport of light through strongly scattering materials D Akbulut | 12 | 2013 |
| Method and apparatus for inspection and metrology F Zijp, D Akbulut, PD Van Voorst, JJM Van De Wijdeven, K Van Berkel US Patent 10,185,224, 2019 | 6 | 2019 |
| Method and apparatus for inspection and metrology F Zijp, ST VAN DER POST, K Fanhe, D Akbulut US Patent 10,126,659, 2018 | 6 | 2018 |
| Measurements on the optical transmission matrices of strongly scattering nanowire layers D Akbulut, T Strudley, J Bertolotti, T Zehender, EPAM Bakkers, ... International Quantum Electronics Conference, IH_P_19, 2013 | 5 | 2013 |
| Metrology apparatus N Pandey, AJ Den Boef, D Akbulut, MJM Van Dam, H Butler, HAJ Cramer, ... US Patent 11,262,661, 2022 | 4 | 2022 |
| Metrology sensor, lithographic apparatus and method for manufacturing devices SA Goorden, N Pandey, D Akbulut, P Alessandro, SR Huisman US Patent 11,086,240, 2021 | 4 | 2021 |
| Position sensor, lithographic apparatus and method for manufacturing devices SR Huisman, SGJ Mathijssen, SA Goorden, D Akbulut, P Alessandro US Patent 10,527,959, 2020 | 4 | 2020 |
| Metrology apparatus, lithographic system, and method of measuring a structure J Ravensbergen, D Akbulut, N Pandey, L Jin US Patent 10,444,640, 2019 | 4 | 2019 |
| Position sensing arrangement and lithographic apparatus including such an arrangement, position sensing method and device manufacturing method SR Huisman, P Alessandro, D Akbulut, SA Goorden, AJ Den Boef US Patent 10,317,808, 2019 | 4 | 2019 |
| Method and apparatus for inspection and metrology K Van Berkel, D Akbulut, JJM Van De Wijdeven, F Zijp US Patent 9,927,722, 2018 | 2 | 2018 |
| Scattering optics resolve nanostructure J Bertolotti, EG van Putten, D Akbulut, WL Vos, A Lagendijk, AP Mosk Nanoengineering: Fabrication, Properties, Optics, and Devices VIII 8102, 22-32, 2011 | 2 | 2011 |
| Lasing action and supercontinuum generation in nano-and micro-structures D Akbulut PQDT-Global, 2009 | 2 | 2009 |
| Apparatus and methods for determining the position of a target structure on a substrate N Pandey, D Akbulut, P Alessandro, SA Goorden US Patent 11,927,891, 2024 | 1 | 2024 |
| High-resolution phase and amplitude modulation using a digital micromirror device SA Goorden, J Bertolotti, H Yılmaz, D Akbulut, WL Vos, AP Mosk The European Conference on Lasers and Electro-Optics, CL_P_14, 2013 | 1 | 2013 |
