PyGGI 2.0: language independent genetic improvement framework G An, A Blot, J Petke, S Yoo Proceedings of the 12th Joint Meeting on Foundations of Software Engineering …, 2019 | 31 | 2019 |
Comparing line and AST granularity level for program repair using PyGGI G An, J Kim, S Yoo Proceedings of the 4th International Workshop on Genetic Improvement …, 2018 | 18 | 2018 |
A Preliminary Evaluation of LLM-Based Fault Localization S Kang*, G An*, S Yoo arXiv preprint arXiv:2308.05487, 2023 | 16 | 2023 |
Searching for multi-fault programs in defects4j G An, J Yoon, S Yoo International Symposium on Search Based Software Engineering, 153-158, 2021 | 13 | 2021 |
PyGGI: Python General framework for Genetic Improvement G An, J Kim, S Lee, S Yoo Proceedings of Korea Software Congress, 536-538, 2017 | 10 | 2017 |
Ahead of Time Mutation Based Fault Localisation using Statistical Inference J Kim, G An, R Feldt, S Yoo 2021 IEEE 32nd International Symposium on Software Reliability Engineering …, 2019 | 9* | 2019 |
FDG: A Precise Measurement of Fault Diagnosability Gain of Test Cases G An, S Yoo Proceedings of the 31st ACM SIGSOFT International Symposium on Software …, 2022 | 8* | 2022 |
Assisting Bug Report Assignment Using Automated Fault Localisation: An Industrial Case Study J Sohn*, G An*, J Hong, D Hwang, S Yoo 2021 14th IEEE Conference on Software Testing, Verification and Validation …, 2021 | 8 | 2021 |
Reducing the search space of bug inducing commits using failure coverage G An, S Yoo Proceedings of the 29th ACM Joint Meeting on European Software Engineering …, 2021 | 7 | 2021 |
Automatically Identifying Shared Root Causes of Test Breakages in SAP HANA G An, J Yoon, J Sohn, J Hong, D Hwang, S Yoo 2022 IEEE/ACM 44th International Conference on Software Engineering …, 2022 | 6 | 2022 |
Fonte: Finding Bug Inducing Commits from Failures G An, J Hong, N Kim, S Yoo 2023 IEEE/ACM 45th International Conference on Software Engineering (ICSE …, 2023 | 3 | 2023 |
Just-in-time flaky test detection via abstracted failure symptom matching G An, J Yoon, T Bach, J Hong, S Yoo arXiv preprint arXiv:2310.06298, 2023 | 2 | 2023 |
The state and future of genetic improvement WB Langdon, W Weimer, C Timperley, O Krauss, ZY Ding, Y Lyu, ... ACM SIGSOFT Software Engineering Notes 44 (3), 25-29, 2019 | 2 | 2019 |
BUGSC++: A Highly Usable Real World Defect Benchmark for C/C++ G An, M Kwon, K Choi, J Yi, S Yoo 2023 38th IEEE/ACM International Conference on Automated Software …, 2023 | 1 | 2023 |
Improving Test Distance for Failure Clustering with Hypergraph Modelling G An, J Yoon, JJ Whang, S Yoo arXiv preprint arXiv:2104.10360, 2021 | 1 | 2021 |
Genetic Improvement@ ICSE 2023 WB Langdon, V Nowack, J Petke, M Wagner, H Lee, EM Fredericks, G An, ... ACM SIGSOFT Software Engineering Notes 48 (4), 51-59, 2023 | | 2023 |
Learning test-mutant relationship for accurate fault localisation J Kim, G An, R Feldt, S Yoo Information and Software Technology 162, 107272, 2023 | | 2023 |