Carbon nanotubes as electron source in an x-ray tube H Sugie, M Tanemura, V Filip, K Iwata, K Takahashi, F Okuyama Applied physics letters 78 (17), 2578-2580, 2001 | 595 | 2001 |
Growth of aligned carbon nanotubes by plasma-enhanced chemical vapor deposition: Optimization of growth parameters M Tanemura, K Iwata, K Takahashi, Y Fujimoto, F Okuyama, H Sugie, ... Journal of applied physics 90 (3), 1529-1533, 2001 | 173 | 2001 |
Modeling the electron field emission from carbon nanotube films V Filip, D Nicolaescu, M Tanemura, F Okuyama Ultramicroscopy 89 (1-3), 39-49, 2001 | 109 | 2001 |
Papers from the 14th International Vacuum Microelectronics Conference-Emission from Carbon Nanotubes-Modeling of field emission nanotriodes with carbon nanotube emitters D Nicolaescu, V Filip, S Kanemaru, J Itoh Journal of Vacuum Science and Technology-Section B-Microelectronics …, 2003 | 87 | 2003 |
Material properties of interfacial silicate layer and its influence on the electrical characteristics of MOS devices using hafnia as the gate dielectric H Wong, B Sen, V Filip, MC Poon Thin Solid Films 504 (1-2), 192-196, 2006 | 64 | 2006 |
Modeling of the electron field emission from carbon nanotubes V Filip, D Nicolaescu, F Okuyama Journal of Vacuum Science & Technology B: Microelectronics and Nanometer …, 2001 | 59 | 2001 |
Temperature-dependent light-emitting characteristics of InGaN/GaN diodes J Liu, WS Tam, H Wong, V Filip Microelectronics Reliability 49 (1), 38-41, 2009 | 57 | 2009 |
Silicon integrated photonics begins to revolutionize H Wong, V Filip, CK Wong, PS Chung Microelectronics Reliability 47 (1), 1-10, 2007 | 51 | 2007 |
Modeling of field emission nanotriodes with carbon nanotube emitters D Nicolaescu, V Filip, S Kanemaru, J Itoh Journal of Vacuum Science & Technology B: Microelectronics and Nanometer …, 2003 | 36 | 2003 |
Current transport and high-field reliability of aluminum/hafnium oxide/silicon structure B Sen, H Wong, V Filip, HY Choi, CK Sarkar, M Chan, CW Kok, MC Poon Thin Solid Films 504 (1-2), 312-316, 2006 | 23 | 2006 |
Review on peculiar issues of field emission in vacuum nanoelectronic devices V Filip, LD Filip, H Wong Solid-State Electronics 138, 3-15, 2017 | 22 | 2017 |
Growth of Y-junction bamboo-shaped CNx nanotubes on GaAs substrate using single feedstock P Ghosh, M Subramanian, RA Afre, M Zamri, T Soga, T Jimbo, V Filip, ... Applied Surface Science 255 (8), 4611-4615, 2009 | 20 | 2009 |
Influence of the electronic structure on the field electron emission from carbon nanotubes V Filip, D Nicolaescu, M Tanemura, F Okuyama Journal of Vacuum Science & Technology B: Microelectronics and Nanometer …, 2003 | 20* | 2003 |
High-density growth of vertically aligned carbon nanotubes with high linearity by catalyst preheating in acetylene atmosphere H Sugie, M Tanemura, V Filip, K Iwata, K Takahashi, F Okuyama Appl. Phys. Lett 78 (17), 2578-2580, 2001 | 20 | 2001 |
Proposal for a new self-focusing configuration involving porous silicon for field emission flat panel displays D Nicolaescu, V Filip, F Okuyama Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films 15 (4 …, 1997 | 19 | 1997 |
Field electron emission from carbon nanotubes grown by plasma-enhanced chemical vapor deposition M Tanemura, V Filip, K Iwata, Y Fujimoto, F Okuyama, D Nicolaescu, ... Journal of Vacuum Science & Technology B: Microelectronics and Nanometer …, 2002 | 17 | 2002 |
Electrochemical recycling of platinum group metals from spent catalytic converters C Diac, FI Maxim, R Tirca, A Ciocanea, V Filip, E Vasile, SN Stamatin Metals 10 (6), 822, 2020 | 16 | 2020 |
Miniature x-ray tubes: current state and future prospects V Filip, LD Filip, F Okuyama Journal of Instrumentation 8 (03), T03005, 2013 | 16 | 2013 |
Emission statistics for Si and HfC emitter arrays after residual gas exposure D Nicolaescu, M Nagao, T Sato, V Filip, S Kanemaru, J Itoh Journal of Vacuum Science & Technology B: Microelectronics and Nanometer …, 2005 | 15 | 2005 |
A conceptual design for a microelectronic ionization vacuum gauge D Nicolaescu, V Filip, F Okuyama Applied surface science 126 (3-4), 292-302, 1998 | 15 | 1998 |