Undoped and in-situ B doped GeSn epitaxial growth on Ge by atmospheric pressure-chemical vapor deposition B Vincent, F Gencarelli, H Bender, C Merckling, B Douhard, DH Petersen, ... Applied Physics Letters 99 (15), 2011 | 253 | 2011 |
Graphene conductance uniformity mapping JD Buron, DH Petersen, P Bøggild, DG Cooke, M Hilke, J Sun, ... Nano letters 12 (10), 5074-5081, 2012 | 216 | 2012 |
Mapping the electrical properties of large-area graphene P Bøggild, DMA Mackenzie, PR Whelan, DH Petersen, JD Buron, ... 2D Materials 4 (4), 042003, 2017 | 136 | 2017 |
Graphene mobility mapping JD Buron, F Pizzocchero, PU Jepsen, DH Petersen, JM Caridad, ... Scientific reports 5 (1), 12305, 2015 | 126 | 2015 |
Atomic layer deposition of ruthenium with TiN interface for sub-10 nm advanced interconnects beyond copper LG Wen, P Roussel, OV Pedreira, B Briggs, B Groven, S Dutta, ... ACS applied materials & interfaces 8 (39), 26119-26125, 2016 | 124 | 2016 |
Reversible hysteresis inversion in MoS2 field effect transistors N Kaushik, DMA Mackenzie, K Thakar, N Goyal, B Mukherjee, P Boggild, ... npj 2D Materials and Applications 1 (1), 34, 2017 | 108 | 2017 |
Micro-four-point probe Hall effect measurement method DH Petersen, O Hansen, R Lin, PF Nielsen Journal of Applied Physics 104 (1), 2008 | 104 | 2008 |
Electrically continuous graphene from single crystal copper verified by terahertz conductance spectroscopy and micro four-point probe JD Buron, F Pizzocchero, BS Jessen, TJ Booth, PF Nielsen, O Hansen, ... Nano letters 14 (11), 6348-6355, 2014 | 102 | 2014 |
Graphene transport properties upon exposure to PMMA processing and heat treatments L Gammelgaard, JM Caridad, A Cagliani, DMA Mackenzie, DH Petersen, ... 2D Materials 1 (3), 035005, 2014 | 98 | 2014 |
A carbon nanofibre scanning probe assembled using an electrothermal microgripper K Carlson, KN Andersen, V Eichhorn, DH Petersen, K Mølhave, IYY Bu, ... Nanotechnology 18 (34), 345501, 2007 | 89 | 2007 |
Accurate microfour-point probe sheet resistance measurements on small samples S Thorsteinsson, F Wang, DH Petersen, TM Hansen, D Kjær, R Lin, ... Review of Scientific Instruments 80 (5), 2009 | 87 | 2009 |
Rapid prototyping of nanotube-based devices using topology-optimized microgrippers O Sardan, V Eichhorn, DH Petersen, S Fatikow, O Sigmund, P Bøggild Nanotechnology 19 (49), 495503, 2008 | 77 | 2008 |
Multimodal electrothermal silicon microgrippers for nanotube manipulation KN Andersen, DH Petersen, K Carlson, K Molhave, O Sardan, ... Nanotechnology, IEEE Transactions on 8 (1), 76-85, 2009 | 70 | 2009 |
Terahertz wafer-scale mobility mapping of graphene on insulating substrates without a gate JD Buron, DMA Mackenzie, DH Petersen, A Pesquera, A Centeno, ... Optics express 23 (24), 30721-30729, 2015 | 69 | 2015 |
High temperature SU-8 pyrolysis for fabrication of carbon electrodes YM Hassan, C Caviglia, S Hemanth, DMA Mackenzie, TS Alstrøm, ... Journal of Analytical and Applied Pyrolysis 125, 91-99, 2017 | 67 | 2017 |
Review of electrical characterization of ultra-shallow junctions with micro four-point probes DH Petersen, O Hansen, TM Hansen, P Bøggild, R Lin, D Kjær, ... Journal of Vacuum Science & Technology B 28 (1), C1C27-C1C33, 2010 | 66 | 2010 |
Optimized laser thermal annealing on germanium for high dopant activation and low leakage current M Shayesteh, D O’Connell, F Gity, P Murphy-Armando, R Yu, K Huet, ... IEEE Transactions on Electron Devices 61 (12), 4047-4055, 2014 | 58 | 2014 |
Quality assessment of terahertz time-domain spectroscopy transmission and reflection modes for graphene conductivity mapping DMA Mackenzie, PR Whelan, P Bøggild, PU Jepsen, A Redo-Sanchez, ... Optics express 26 (7), 9220-9229, 2018 | 57 | 2018 |
Note: Optical fiber milled by focused ion beam and its application for Fabry-Pérot refractive index sensor W Yuan, F Wang, A Savenko, DH Petersen, O Bang Review of Scientific Instruments 82 (7), 2011 | 57 | 2011 |
Defect evolution and dopant activation in laser annealed Si and Ge F Cristiano, M Shayesteh, R Duffy, K Huet, F Mazzamuto, Y Qiu, M Quillec, ... Materials Science in Semiconductor Processing 42, 188-195, 2016 | 53 | 2016 |