| A new SEC-DED error correction code subclass for adjacent MBU tolerance in embedded memory A Neale, M Sachdev IEEE Transactions on Device and Materials Reliability 13 (1), 223-230, 2012 | 107 | 2012 |
| Adjacent-MBU-tolerant SEC-DED-TAEC-yAED codes for embedded SRAMs A Neale, M Jonkman, M Sachdev IEEE Transactions on Circuits and Systems II: Express Briefs 62 (4), 387-391, 2014 | 58 | 2014 |
| Interactive online tutorial assistance for a first programming course CCW Hulls, AJ Neale, BN Komalo, V Petrov, DJ Brush IEEE Transactions on Education 48 (4), 719-728, 2005 | 32 | 2005 |
| Neutron radiation induced soft error rates for an adjacent-ECC protected SRAM in 28 nm CMOS A Neale, M Sachdev IEEE Transactions on Nuclear Science 63 (3), 1912-1917, 2016 | 31 | 2016 |
| 8T1R: A novel low-power high-speed RRAM-based non-volatile SRAM design AMST Abdelwahed, A Neale, M Anis, L Wei Proceedings of the 26th edition on Great Lakes Symposium on VLSI, 239-244, 2016 | 29 | 2016 |
| Hybrid latch-type offset tolerant sense amplifier for low-voltage SRAMs D Patel, A Neale, D Wright, M Sachdev IEEE Transactions on Circuits and Systems I: Regular Papers 66 (7), 2519-2532, 2019 | 15 | 2019 |
| Body biased sense amplifier with auto-offset mitigation for low-voltage SRAMs D Patel, A Neale, D Wright, M Sachdev IEEE Transactions on Circuits and Systems I: Regular Papers 68 (8), 3265-3278, 2021 | 14 | 2021 |
| A reliability overview of Intel’s 10+ logic technology R Grover, T Acosta, C AnDyke, E Armagan, C Auth, S Chugh, K Downes, ... 2020 IEEE International Reliability Physics Symposium (IRPS), 1-6, 2020 | 12 | 2020 |
| Design and analysis of an adjacent multi-bit error correcting code for nanoscale SRAMs A Neale University of Waterloo, 2014 | 12 | 2014 |
| Digitally programmable SRAM timing for nano-scale technologies A Neale, M Sachdev 2011 12th International Symposium on Quality Electronic Design, 1-7, 2011 | 8 | 2011 |
| A low energy SRAM-based physically unclonable function primitive in 28 nm CMOS A Neale, M Sachdev 2015 IEEE Custom Integrated Circuits Conference (CICC), 1-4, 2015 | 7 | 2015 |
| Digital timing control in SRAMs for yield enhancement and graceful aging degradation A Neale University of Waterloo, 2010 | 7 | 2010 |
| A 0.4 V 75 kbit SRAM macro in 28 nm CMOS featuring a 3-adjacent MBU correcting ECC A Neale, M Sachdev Proceedings of the IEEE 2014 Custom Integrated Circuits Conference, 1-4, 2014 | 6 | 2014 |
| On the correlation of laser-induced and high-energy proton beam-induced single event latchup B Ajdari, S Sekwao, R Ascazubi, A Neale, N Seifert 2020 IEEE International Reliability Physics Symposium (IRPS), 1-5, 2020 | 5 | 2020 |
| The Road to Success for STEM Student-Athletes A Neale, O Grant, M Sachdev 2012 ASEE Annual Conference & Exposition, 25.1336. 1-25.1336. 26, 2012 | 3 | 2012 |
| On the efficacy of using proton beams for estimating neutron-induced soft error rates S Jahinuzzaman, N Seifert, S Sekwao, A Neale 2017 IEEE International Reliability Physics Symposium (IRPS), SE-6.1-SE-6.6, 2017 | 2 | 2017 |
| A Chip-Level Single-Event Latchup (SEL) Estimation Methodology A Neale, N Seifert IEEE Transactions on Nuclear Science 67 (1), 15-21, 2019 | 1 | 2019 |
| Online Computer Simulation Tools For Dipole Antenna Radiation Patterns A Neale, J Shirtliff, W Bishop, CS Rios 2007 Annual Conference & Exposition, 12.1125. 1-12.1125. 14, 2007 | | 2007 |
| AC 2007-1062: ONLINE COMPUTER SIMULATION TOOLS FOR DIPOLE ANTENNA RADIATION PATTERNS A Neale, J Shirtliff, W Bishop, CS Rios age 12, 1, 2007 | | 2007 |
