| Collaboration capability in virtual teams: Examining the influence on diversity and innovation FS Batarseh, JM Usher, JJ Daspit International Journal of Innovation Management 21 (04), 1750034, 2017 | 77 | 2017 |
| Absorptive capacity in virtual teams: examining the influence on diversity and innovation FS Batarseh, JM Usher, JJ Daspit Journal of Knowledge Management 21 (6), 1342-1361, 2017 | 53 | 2017 |
| The collaboration capability of global virtual teams: relationships with functional diversity, absorptive capacity, and innovation FS Batarseh, JJ Daspit, JM Usher International Journal of Management Science and Engineering Management 13 (1 …, 2018 | 31 | 2018 |
| Methodology to extract, data mine and score geometric constructs from physical design layouts for analysis and applications in semiconductor manufacturing P Pathak, K Krishnamoorthy, WL Wang, YC Lai, FE Gennari, S Somani, ... Design-Process-Technology Co-optimization for Manufacturability X 9781, 77-88, 2016 | 14 | 2016 |
| Deep learning-based hotspot prediction of via printability in process window corners P Selvam, P Rezaeifakhr, UP Schroeder, J Bakshi, O Mohamed, ... Design-Process-Technology Co-optimization XV 11614, 173-180, 2021 | 6 | 2021 |
| Collaborative capacity in virtual teams: Examining the influence on diversity and innovation FS Batarseh, JM Usher, J Daspit International Journal of Innovation Management 21 (6), 1-29, 2017 | 6 | 2017 |
| Hybrid OPC flow with pattern search and replacement P Verma, S Somani, YY Ping, P Pathak, RS Ghaida, CP Babcock, ... Optical Microlithography XXVIII 9426, 254-261, 2015 | 6 | 2015 |
| Pattern-based pre-OPC operation to improve model-based OPC runtime P Verma, F Batarseh, S Somani, J Wang, S McGowan, S Madhavan Photomask Technology 2014 9235, 21-31, 2014 | 6 | 2014 |
| Model-based virtual VSB mask writer verification for efficient mask error checking and optimization prior to MDP RC Pack, K Standiford, T Lukanc, GX Ning, P Verma, F Batarseh, ... Photomask Technology 2014 9235, 42-53, 2014 | 6 | 2014 |
| Retargeting-aware design for manufacturability (DFM) checks using machine learning LTN Wang, UP Schroeder, P Selvam, F Batarseh, P Rezaeifakhr, ... DTCO and Computational Patterning 12052, 254-262, 2022 | 3 | 2022 |
| Pattern similarity profiling using semi-supervised learning algorithm F Batarseh, UP Schroeder, J Nelson, YC Lai, P Pathak, S Madhavan, ... Design-Process-Technology Co-optimization XV 11614, 36-42, 2021 | 3 | 2021 |
| Dynamic pattern matching flow to enable low escape rate weak point detection UP Schroeder, J Bakshi, AM Elsemary, F Batarseh Design-Process-Technology Co-optimization for Manufacturability XIV 11328, 77-83, 2020 | 3 | 2020 |
| Litho friendly via insertion with in-design auto-fix flow using machine learning AM Elsemary, M Fakhry, J Bakshi, N Shah, M Ismail, F Batarseh, ... Design-Process-Technology Co-optimization for Manufacturability XII 10588 …, 2018 | 3 | 2018 |
| Dynamic pattern match searching flow to enable precise hotspot detection F Batarseh, UP Schroeder, J Nelson, P Pathak, WL Wang, YC Lai DTCO and Computational Patterning 12052, 179-184, 2022 | 2 | 2022 |
| Multi-stage pattern recognition in circuit designs UP Schroeder, F Batarseh, K Krishnamoorthy, A Omran US Patent 10,248,754, 2019 | 2 | 2019 |
| Design for manufacturability (DFM) physical verification using machine learning LTN Wang, KP Johnsen, I Tanev, F Batarseh, C Su, P Rezaeifakhr, ... DTCO and Computational Patterning II 12495, 328-335, 2023 | 1 | 2023 |
| Design for manufacturability (DFM) in-design fixing for improving manufacturability aware scoring (MAS) ADJR Ruiz, LTN Wang, F Batarseh, UP Schroeder DTCO and Computational Patterning II 12495, 177-187, 2023 | 1 | 2023 |
| Machine learning architecture evaluation for fast and accurate weak point detection SS Tellakula, UP Schroeder, J Bakshi, P Selvam, F Batarseh, ... DTCO and Computational Patterning 12052, 125-133, 2022 | 1 | 2022 |
| An Empirical Model of Collaboration Capability and Absorptive Capacity in Virtual Teams: a Multi-Dimensional Investigation using Confirmatory Factor Analysis FS Batarseh | 1 | 2016 |
| In-design DFM pattern optimization with ML models for dynamic fixing guidance selection and implementation F Batarseh, P Pathak, J Condella, K Bhoopanam, J Nelson, L Wang, ... DTCO and Computational Patterning III 12954, 1295406, 2024 | | 2024 |
