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Co-authors
Andrew L. KunProfessor of Electrical and Computer Engineering, University of New HampshireVerified email at unh.edu
S M SHAFIUL ALAM, PhDResearch Scientist, Idaho National Laboratory (INL)Verified email at inl.gov
M. I. H. BhuiyanProfessor, EEE, BUETVerified email at eee.buet.ac.bd