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Koutsoureli Matroni
Koutsoureli Matroni
University of Athens, Physics Department
Verified email at phys.uoa.gr - Homepage
Title
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Cited by
Year
Effect of deposition conditions on charging processes in SiNx: Application to RF-MEMS capacitive switches
R Daigler, E Papandreou, M Koutsoureli, G Papaioannou, ...
Microelectronic Engineering 86 (3), 404-407, 2009
552009
Assessment of dielectric charging in electrostatically driven MEMS devices: A comparison of available characterization techniques
U Zaghloul, M Koutsoureli, H Wang, F Coccetti, G Papaioannou, P Pons, ...
Microelectronics Reliability 50 (9-11), 1615-1620, 2010
342010
A study of field emission process in electrostatically actuated MEMS switches
L Michalas, A Garg, A Venkattraman, M Koutsoureli, A Alexeenko, ...
Microelectronics Reliability 52 (9-10), 2267-2271, 2012
332012
Determination of long time discharge current in microelectromechanical system capacitive switches
M Koutsoureli, G Papaioannou
Applied Physics Letters 99 (10), 2011
302011
The effect of silicon nitride stoichiometry on charging mechanisms in RF-MEMS capacitive switches
N Tavassolian, M Koutsoureli, E Papandreou, G Papaioannou, B Lacroix, ...
IEEE Transactions on Microwave Theory and Techniques 57 (12), 3518-3524, 2009
302009
Dielectric charging in capacitive microelectromechanical system switches with silicon nitride
M Koutsoureli, N Tavassolian, G Papaioannou, J Papapolymerou
Applied Physics Letters 98 (9), 2011
282011
Investigation of silicon nitride charging
M Koutsoureli, E Papandreou, L Michalas, G Papaioannou
Microelectronic Engineering 90, 145-148, 2012
262012
Engineering of porphyrin molecules for use as effective cathode interfacial modifiers in organic solar cells of enhanced efficiency and stability
M Tountas, A Verykios, E Polydorou, A Kaltzoglou, A Soultati, N Balis, ...
ACS applied materials & interfaces 10 (24), 20728-20739, 2018
252018
Low work function lacunary polyoxometalates as electron transport interlayers for inverted polymer solar cells of improved efficiency and stability
M Tountas, Y Topal, E Polydorou, A Soultati, A Verykios, A Kaltzoglou, ...
ACS Applied Materials & Interfaces 9 (27), 22773-22787, 2017
232017
Probing contactless injection dielectric charging in RF MEMS capacitive switches
L Michalas, M Koutsoureli, G Papaioannou
Electronics letters 50 (10), 766-768, 2014
232014
A study of deposition conditions on charging properties of PECVD silicon nitride films for MEMS capacitive switches
M Koutsoureli, L Michalas, A Gantis, G Papaioannou
Microelectronics Reliability 54 (9-10), 2159-2163, 2014
212014
Charge collection mechanism in MEMS capacitive switches
M Koutsoureli, L Michalas, G Papaioannou
2012 IEEE international reliability physics symposium (IRPS), ME. 2.1-ME. 2.5, 2012
182012
The effect of temperature on dielectric charging of capacitive MEMS
M Koutsoureli, L Michalas, G Papaioannou
2011 International Reliability Physics Symposium, 3D. 4.1-3D. 4.7, 2011
182011
An in depth analysis of pull-up capacitance-voltage characteristic for dielectric charging assessment of MEMS capacitive switches
M Koutsoureli, D Birmpiliotis, L Michalas, G Papaioannou
Microelectronics Reliability 64, 688-692, 2016
162016
Determination of bulk discharge current in the dielectric film of MEMS capacitive switches
MS Koutsoureli, GJ Papaioannou
Microelectronics Reliability 51 (9-11), 1874-1877, 2011
162011
Properties of contactless and contacted charging in MEMS capacitive switches
M Koutsoureli, L Michalas, P Martins, E Papandreou, A Leuliet, ...
Microelectronics Reliability 53 (9-11), 1655-1658, 2013
142013
Temperature effects on the bulk discharge current of dielectric films of MEMS capacitive switches
M Koutsoureli, L Michalas, G Papaioannou
Microelectronics Reliability 52 (9-10), 2240-2244, 2012
142012
Optimization of dielectric material stoichiometry for high-reliability capacitive MEMS switches
N Tavassolian, M Koutsoureli, G Papaioannou, J Papapolymerou
IEEE Microwave and wireless components letters 26 (3), 174-176, 2016
132016
Alpha particle radiation effects in RF MEMS capacitive switches
J Ruan, E Papandreou, M Lamhamdi, M Koutsoureli, F Coccetti, P Pons, ...
Microelectronics Reliability 48 (8-9), 1241-1244, 2008
132008
On the discharge transport mechanisms through the dielectric film in MEMS capacitive switches
D Birmpiliotis, G Stavrinidis, M Koutsoureli, G Konstantinidis, ...
Journal of Microelectromechanical Systems 29 (2), 202-213, 2020
112020
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