| The quantum Hall effect as an electrical resistance standard B Jeckelmann, B Jeanneret Reports on Progress in Physics 64 (12), 1603, 2001 | 374 | 2001 |
| Inductive conductance measurements in two‐dimensional superconducting systems B Jeanneret, JL Gavilano, GA Racine, C Leemann, P Martinoli Applied physics letters 55 (22), 2336-2338, 1989 | 170 | 1989 |
| Application of the Josephson effect in electrical metrology B Jeanneret, SP Benz The European Physical Journal Special Topics 172 (1), 181-206, 2009 | 151 | 2009 |
| Determination of the Planck constant with the METAS watt balance A Eichenberger, H Baumann, B Jeanneret, B Jeckelmann, P Richard, ... metrologia 48 (3), 133, 2011 | 126 | 2011 |
| High-precision measurements of the quantized Hall resistance: Experimental conditions for universality B Jeckelmann, B Jeanneret, D Inglis Physical Review B 55 (19), 13124, 1997 | 84 | 1997 |
| $ RLC $ bridge based on an automated synchronous sampling system F Overney, B Jeanneret IEEE Transactions on Instrumentation and Measurement 60 (7), 2393-2398, 2011 | 71 | 2011 |
| In situ noble metal YBa2Cu3O7 thin‐film contacts JW Ekin, SE Russek, CC Clickner, B Jeanneret Applied physics letters 62 (4), 369-371, 1993 | 71 | 1993 |
| Characterization of metrological grade analog-to-digital converters using a programmable Josephson voltage standard F Overney, A Rufenacht, JP Braun, B Jeanneret, PS Wright IEEE Transactions on Instrumentation and Measurement 60 (7), 2172-2177, 2011 | 68 | 2011 |
| Scanning tunneling microscopy of the surface morphology of YBa2Cu3Ox thin films between 300 and 76 K J Moreland, P Rice, SE Russek, B Jeanneret, A Roshko, RH Ono, ... Applied physics letters 59 (23), 3039-3041, 1991 | 67 | 1991 |
| Josephson-based full digital bridge for high-accuracy impedance comparisons F Overney, NE Flowers-Jacobs, B Jeanneret, A Rüfenacht, AE Fox, ... Metrologia 53 (4), 1045, 2016 | 60 | 2016 |
| A proposal for a new moving-coil experiment W Beer, B Jeanneret, B Jeckelmann, P Richard, A Courteville, Y Salvade, ... ieee Transactions on Instrumentation and Measurement 48 (2), 192-195, 1999 | 53 | 1999 |
| Material, device, and step independence of the quantized Hall resistance B Jeckelmann, AD Inglis, B Jeanneret IEEE transactions on instrumentation and measurement 44 (2), 269-272, 1995 | 52 | 1995 |
| Realization of an inductance scale traceable to the quantum Hall effect using an automated synchronous sampling system F Overney, B Jeanneret Metrologia 47 (6), 690, 2010 | 51 | 2010 |
| Josephson-voltage-standard-locked sine wave synthesizer: Margin evaluation and stability B Jeanneret, F Overney, L Callegaro, A Mortara, A Rufenacht IEEE Transactions on Instrumentation and Measurement 58 (4), 791-796, 2008 | 48 | 2008 |
| The quantum Hall effect as an electrical resistance standard B Jeckelmann, B Jeanneret Measurement Science and Technology 14 (8), 1229, 2003 | 45 | 2003 |
| Observation of the integer quantum Hall effect by magnetic coupling to a Corbino ring B Jeanneret, BD Hall, HJ Bühlmann, R Houdré, M Ilegems, B Jeckelmann, ... Physical Review B 51 (15), 9752, 1995 | 43 | 1995 |
| Impedance bridges: from Wheatstone to Josephson F Overney, B Jeanneret Metrologia 55 (5), S119, 2018 | 40 | 2018 |
| Comparison of quantum Hall effect resistance standards of the OFMET and the BIPM F Delahaye, TJ Witt, B Jeckelmann, B Jeanneret Metrologia 32 (5), 385, 1995 | 39 | 1995 |
| Compendium for precise ac measurements of the quantum Hall resistance FJ Ahlers, B Jeanneret, F Overney, J Schurr, BM Wood Metrologia 46 (5), R1, 2009 | 38 | 2009 |
| High precision comparison between SNS and SIS Josephson voltage standards B Jeanneret, A Rufenacht, CJ Burroughs IEEE Transactions on Instrumentation and Measurement 50 (2), 188-191, 2001 | 38 | 2001 |
Frédéric OverneyMETASVerified email at metas.ch
