| An interface clusters mixture model for the structure of amorphous silicon monoxide (SiO) A Hohl, T Wieder, PA Van Aken, TE Weirich, G Denninger, M Vidal, ... Journal of Non-Crystalline Solids 320 (1-3), 255-280, 2003 | 311 | 2003 |
| Residual stresses in alumina-SiC nanocomposites I Levin, WD Kaplan, DG Brandon, T Wieder Acta metallurgica et materialia 42 (4), 1147-1154, 1994 | 89 | 1994 |
| Reflectometry studies of the oxidation kinetics of thin copper films A Njeh, T Wieder, H Fuess Surface and Interface Analysis: An International Journal devoted to the …, 2002 | 50 | 2002 |
| Microstructure analysis of ohmic contacts on MBE grown n-GaSb and investigation of sub-micron contacts J Sigmund, M Saglam, A Vogt, HL Hartnagel, V Buschmann, T Wieder, ... Journal of crystal growth 227, 625-629, 2001 | 25 | 2001 |
| The effect of depth-dependent residual stresses on the propagation of surface acoustic waves in thin Ag films on Si Y Wali, A Njeh, T Wieder, MHB Ghozlen NDT & E International 40 (7), 545-551, 2007 | 17 | 2007 |
| Effect of Cr content on the crystal structure and lattice dynamics of FCC Fe–Cr–Ni–N austenitic alloys A Beskrovni, S Danilkin, H Fuess, E Jadrowski, M Neova-Baeva, T Wieder Journal of alloys and compounds 291 (1-2), 262-268, 1999 | 17 | 1999 |
| Algorithm 794: Numerical Hankel transform by the Fortran program HANKEL T Wieder ACM Transactions on Mathematical Software (TOMS) 25 (2), 240-250, 1999 | 13 | 1999 |
| Phonon dispersion and elastic constants in Fe-Cr-Mn-Ni austenitic steel SA Danilkin, H Fuess, T Wieder, A Hoser Journal of materials science 36, 811-814, 2001 | 12 | 2001 |
| Grazing excidence diffraction versus grazing incidence diffraction for strain/stress evaluation in thin films A Njeh, T Wieder, H Fuess Powder diffraction 15 (4), 211-216, 2000 | 12 | 2000 |
| Tiefenauflösende röntgenographische Dehnungsmessungen an TiN-Schichten in Seemann-Bohlin-Geometrie J Zendehroud, T Wieder, K Thoma, H Gärtner HTM Journal of Heat Treatment and Materials 48 (1), 41-49, 1993 | 12 | 1993 |
| Lattice constant determination by grazing incidence diffraction in thin cubic films under thermal strain T Wieder Thin Solid Films 256 (1-2), 39-43, 1995 | 11 | 1995 |
| The number of hierarchical orderings NJA Sloane, T Wieder Order 21 (1), 83-89, 2004 | 10 | 2004 |
| A generalized Debye scattering equation T Wieder, H Fuess Zeitschrift für Naturforschung A 52 (5), 386-392, 1997 | 10 | 1997 |
| SBGBBG, a program to evaluate the macroscopic strain/stress tensor of a polycrystalline sample from X-ray reflection positions T Wieder Computer physics communications 85 (3), 398-414, 1995 | 10 | 1995 |
| On the strain-free lattice constants in residual stress evaluation by diffraction T Wieder Journal of Structural Geology 22 (11-12), 1601-1607, 2000 | 8 | 2000 |
| A generalized Debye scattering formula and the Hankel transform T Wieder Zeitschrift für Naturforschung A 54 (2), 124-130, 1999 | 6 | 1999 |
| X-ray and neutron scattering study of the Nb-O solid solutions S Danilkin, H Fueß, E Jadrowski, T Wieder, H Wipf Journal of alloys and compounds 266 (1-2), 230-233, 1998 | 6 | 1998 |
| Calculation of thermally induced strains in thin films of any crystal class T Wieder Journal of applied physics 78 (2), 838-841, 1995 | 6 | 1995 |
| Phonon dispersion in austenitic stainless steel Fe18Cr12Ni2Mo M Hoelzel, SA Danilkin, A Hoser, H Ehrenberg, T Wieder, H Fuess Applied Physics A 74, s1013-s1015, 2002 | 5 | 2002 |
| Surface wave propagation in thin silver films under residual stress A Njeh, T Wieder, D Schneider, H Fuess, MHB Ghozlen Zeitschrift für Naturforschung A 57 (9-10), 58-64, 2002 | 5 | 2002 |
Sergey DanilkinAustralian Nuclear Science and Technology OrganisationVerified email at ansto.gov.au
