| Elastic scattering corrections in AES and XPS. II. Estimating attenuation lengths and conditions required for their valid use in overlayer/substrate experiments PJ Cumpson, MP Seah Surface and Interface Analysis: An International Journal devoted to the …, 1997 | 723 | 1997 |
| Angle-resolved XPS and AES: depth-resolution limits and a general comparison of properties of depth-profile reconstruction methods PJ Cumpson Journal of Electron Spectroscopy and Related Phenomena 73 (1), 25-52, 1995 | 416 | 1995 |
| The Thickogram: a method for easy film thickness measurement in XPS PJ Cumpson Surface and Interface Analysis: An International Journal devoted to the …, 2000 | 250 | 2000 |
| Estimation of inelastic mean free paths for polymers and other organic materials: use of quantitative structure–property relationships PJ Cumpson Surface and Interface Analysis: An International Journal devoted to the …, 2001 | 208* | 2001 |
| Demonstration of chemistry at a point through restructuring and catalytic activation at anchored nanoparticles D Neagu, EI Papaioannou, WKW Ramli, DN Miller, BJ Murdoch, ... Nature communications 8 (1), 1855, 2017 | 148 | 2017 |
| A three-dimensional Mn 3 O 4 network supported on a nitrogenated graphene electrocatalyst for efficient oxygen reduction reaction in alkaline media SK Bikkarolla, F Yu, W Zhou, P Joseph, P Cumpson, P Papakonstantinou Journal of Materials Chemistry A 2 (35), 14493-14501, 2014 | 133 | 2014 |
| Random uncertainties in AES and XPS: I: Uncertainties in peak energies, intensities and areas derived from peak synthesis PJ Cumpson, MP Seah Surface and interface analysis 18 (5), 345-360, 1992 | 116 | 1992 |
| The quartz crystal microbalance; radial/polar dependence of mass sensitivity both on and off the electrodes PJ Cumpson, MP Seah Measurement Science and Technology 1 (7), 544, 1990 | 113 | 1990 |
| Oxygen reduction reaction by electrochemically reduced graphene oxide SK Bikkarolla, P Cumpson, P Joseph, P Papakonstantinou Faraday discussions 173, 415-428, 2014 | 106 | 2014 |
| Accurate analytical measurements in the atomic force microscope: a microfabricated spring constant standard potentially traceable to the SI PJ Cumpson, J Hedley Nanotechnology 14 (12), 1279, 2003 | 87 | 2003 |
| Quantitative analytical atomic force microscopy: a cantilever reference device for easy and accurate AFM spring-constant calibration PJ Cumpson, CA Clifford, J Hedley Measurement Science and Technology 15 (7), 1337, 2004 | 82 | 2004 |
| Accurate force measurement in the atomic force microscope: a microfabricated array of reference springs for easy cantilever calibration PJ Cumpson, J Hedley, P Zhdan Nanotechnology 14 (8), 918, 2003 | 78 | 2003 |
| Practical estimation of XPS binding energies using widely available quantum chemistry software S Tardio, P Cumpson Surface and Interface Analysis, 2017 | 71 | 2017 |
| Simple method of depth profiling (stratifying) contamination layers, illustrated by studies on stainless steel MP Seah, JH Qiu, PJ Cumpson, JE Castle Surface and interface analysis 21 (6‐7), 336-341, 1994 | 71 | 1994 |
| Copper–Indium Binary Catalyst on a Gas Diffusion Electrode for High-Performance CO2 Electrochemical Reduction with Record CO Production Efficiency H Xiang, S Rasul, B Hou, J Portoles, P Cumpson, EH Yu ACS applied materials & interfaces 12 (1), 601-608, 2019 | 66 | 2019 |
| Angle-resolved XPS depth-profiling strategies PJ Cumpson Applied surface science 144, 16-20, 1999 | 65 | 1999 |
| Calibration of AFM cantilever stiffness: a microfabricated array of reflective springs PJ Cumpson, P Zhdan, J Hedley Ultramicroscopy 100 (3-4), 241-251, 2004 | 64 | 2004 |
| Elastic scattering corrections in AES and XPS: I. Two rapid Monte Carlo methods for calculating the depth distribution function PJ Cumpson Surface and interface analysis 20 (8), 727-741, 1993 | 60 | 1993 |
| Stability of reference masses. IV: Growth of carbonaceous contamination on platinum-iridium alloy surfaces, and cleaning by UV/ozone treatment PJ Cumpson, MP Seah Metrologia 33 (6), 507, 1996 | 54 | 1996 |
| Chemically specific identification of carbon in XPS imaging using Multivariate Auger Feature Imaging (MAFI) AJ Barlow, S Popescu, K Artyushkova, O Scott, N Sano, J Hedley, ... Carbon 107, 190-197, 2016 | 53 | 2016 |
